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Degang Chen received his BS degree in instrumentation and automation from Tsinghua University, China, in 1984 and his PhD degree in control theory from UC Santa Barbara, CA, USA, in 1992.
He was the John R. Pierce Instructor at CalTech in 1992. After that, he joined Iowa State University where he is currently Professor of Electrical Engineering and the Jerry Junkins Chair in the College Engineering. His industry experience includes Beijing Institute of Control Engineering in 1984-1986, the Boeing Company in 1999 summer, Maxim Integrated in 2001 summer, and Texas Instruments in 2011, 2012 and 2014 summers. His current research interests are in analog and mixed-signal IC design and testing, integrated sensor design, analog verification, and built-in self-test self-calibration for enhancing performance and reliability.
Dr. Chen has authored and co-authored 8 patents and over 280 refereed publications in leading journals and top international conferences. Of those papers, 14 received best paper awards and other honors, including the prestigious IEEE Ned Kornfield Best Paper Award in 2013 and again in 2014. He has frequently delivered technical seminars at most leading semiconductor companies such as Texas Instruments, Intel, Broadcom, Qualcomm, IBM, Infineon, NVidia, Xilinx, etc., as well as at various universities.
Dr. Chen is a Fellow of the IEEE, and is an IEEE Instrumentation and Measurement Society Distinguished Lecture.